By Weilie Zhou
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Extra resources for Advanced scanning microscopy for nanotechnology techniques and applications
In general this performance is quite satisfactory because of the way in which secondary electron images are interpreted . The viewpoint of the operator is effectively looking down along the beam direction onto the specimen, which is being illuminated by light emitted from the detector assembly. , edges, corners, steps, and surface roughness) is shadowed or highlighted depending on the relative position of the feature and the detector. This type of image contrast is intuitively easy and reliable to interpret and produces aesthetically pleasing micrographs.
12 (1989) 146. 15. -R. Peters, J. , 118 (1980) 429. 16. R. P. Apkarian and J. C. Curtis, Scan. , 4 (1981) 165. 17. A. Boyde, Scan. , 11 (1978) 303. 18. T. F. Anderson, NY Acad. , 13 (1951) 130–134. 19. R. P. , 8(2) (1994) 289. 20. -R. Peters, Scan. , 4 (1985) 1519. 21. R. P. Apkarian, 45th Annual Proceedings of the Microscopy Society of America (1987) 564. 22. D. C. Joy, 52nd Annual Proceedings of the Microscopy Society of America (1994). 23. E. L. Bearer, L. Orci, P. Sors, J. , 100 (1985) 418.
1. History The discovery of the fundamental diffraction on which EBSD is based can be traced back to 1928, when Shoji Nishikawa and Seishi Kikuchi (Fig. 1) directed a beam of 50 keV electrons from a gas discharge on a cleavage face of calcite at a grazing incidence of 6˚. 4 cm behind and in front of the crystal, respectively, normal to the primary beam. black and white lines in pairs due to multiple scattering and selective reflection”  (Figs. 3). Shinohara  and Meibohm and Rupp independently saw the same phenomenon shortly after Kikuchi.
Advanced scanning microscopy for nanotechnology techniques and applications by Weilie Zhou